@InProceedings{NPKS04,
author={G. Norman and D. Parker and M. Kwiatkowska and S. Shukla},
title={Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking},
booktitle={Proc. International Conference on {VLSI} Design ({VSLI}'04)},
year={2004},

editor={},
pages={907-914},
organization={},
publisher={IEEE Computer Society Press},
series={},
volume={},
address={},
month={},
note={},
key={}
}