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[HMS15b]
Ghaith Bany Hamad, Otmane Ait Mohamed, and Yvon Savaria.
Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients.
In Proc. 21st IEEE International On-Line Testing Symposium (IOLTS'15), pages 1-6.
2015.
[Develops a methodology to investigate the impact of Single Event Transients (SETs) on digital design reliability using PRISM.]
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